Advanced Characterization Methods for PV

Freiburg, Fraunhofer ISE - Thursday, January 14th 2016

Session I: Materials

1.4 S. Binetti, Unimib (I), “Photoluminescence and Raman spectroscopy for defect identification in Silicon, CIGS and CZTS thin films”

Abstract: In this presentation the potentiality of using PL and Raman spectroscopy for defect identifications in PV materials will be discussed. The advantages of using these tools in optimization of a growth process will be presented with some examples of our recent results.