Advanced Characterization Methods for PV

Freiburg, Fraunhofer ISE - Thursday, January 14th 2016

Session III: Modules & Systems

3.2 M. Rennhofer, Austrian Institute of Technology AIT (AU), “Degradation and electric behavior in thin film photovoltaic devices”

Abstract: Behavior of thin film photovoltaic devices is different considering operation in the field and measurement in the lab. In the latter especially the reproducible and harmonized measurement of the output power (power rating) in the laboratory is an unsolved problem. Not only new technologies, also well-established technologies like CdTe and CIGS cannot be measured stable and reproducible without huge effort due to intrinsic metastable electric behavior under any kind of illumination. The presented study shows the correlation of this metastable behavior to the device quality for the CdTe and CIGS technology.