Advanced Characterization Methods for PV

Freiburg, Fraunhofer ISE - Thursday, January 14th 2016

Session III: Modules & Systems

3.4 J. Kroon, ECN (NL), “Accurate yearly yield calculation using PV module fingerprint method applied for MWT, H-pattern and thin film modules”

Abstract: A simple and accurate method will be presented to determine the yearly yield of a module in kWh/kWp for x-Si (MWT back contact and H-pattern) and thin film modules based on the “fingerprint” of a module. The input for the fingerprint is the irradiance, ambient and module temperature and power output of the module recorded outdoors during a limited timeframe.  The accuracy of the method was determined by comparing the calculated yield with actual measured yield.