Advanced Characterization Methods for PV

Freiburg, Fraunhofer ISE - Thursday, January 14th 2016

Session I: Materials

1.1 I. Lauerman, HZB (D), “X-ray based analysis of PV materials and components"

Abstract: The use of x-ray based spectroscopy like x-ray photoemission, x-ray absorption and x-ray emission spectroscopy for the characterization of materials and components used in photovoltaic devices is described. The emphasis is on thin film materials like chalcopyrites, kesterites, perovskites and TCO. Examples will be given on the chemical analysis of surfaces and interfaces of these materials and on the determination of electronic properties like work functions and band offsets.